Specialty Logic
Specialty Logic ICs are designed to provide an application specific logic output type such as BCD rate multiplication, addressable scan port, bus termination array, CML driver, comparator, ABT scan test, binary full adder, complimentary pair plus inverter, configurable buffer, contact bounce eliminator, crystal oscillator, delay element, differential receiver, LVTTL-to-GTLP transceiver, memory decoder, power good detector, and frequency divider.
| Part Number | Manufacturer | Description | Quantity | Price | Option |
|---|---|---|---|---|---|
SN74F283NSRE4
|
Texas Instruments | IC FULL ADDER 4BIT BIN 16SO | 0 | $0.00 | |
SN74F283NSR
|
Texas Instruments | IC FULL ADDER 4BIT BIN 16SO | 0 | $0.00 | |
SN74BCT8374ANTG4
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 0 | $0.00 | |
SN74BCT8374ANT
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 0 | $0.00 | |
SN74BCT8374ADWRE4
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 0 | $0.00 | |
SN74BCT8374ADWR
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 0 | $0.00 | |
SN74BCT8373ANT
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | 0 | $0.00 | |
SN74BCT8373ADWRE4
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 0 | $0.00 | |
SN74BCT8373ADWR
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 0 | $0.00 | |
SN74BCT8245ANTG4
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 0 | $0.00 |
SN74F283NSRE4
SN74BCT8374ANTG4
SN74BCT8374ADWRE4